NanoMaterials & Surface Characterization

Quantiam currently houses the most powerful nano and surface analysis tools within Canada's private sector. With our extensive in-house capabilities, we can provide unique technical services in characterization of NanoMaterials, surfaces, coatings and monolithic products with rapid turn-around and internet-based instrument control.

Small-spot XPS (PHI 5600)

Quantiam’s small spot X-ray Photoelectron Spectroscopy System
(30 micron diameter to 0.8×2 mm2) can provide quantitative
element analysis and information of the chemical states of the surfaces of most solid materials.  Surface cleaning and depth profiling with argon sputtering is achieved by a programmable,
1-5 kV raster ion gun.  A low energy electron flood gun was
equipped for charge compensation.  The unit is equipped with an aluminum (Al) anode, monochromatic X-ray source and a magnesium / aluminum (Mg/Al) dual anode X-ray source.

A 150 mm diameter hemispherical energy analyzer (16-channel micro-channel plates detector, pass energy from 2.9 to 175 eV, best energy resolution at Ag3d = 0.8 eV) provides superb photoelectron energy analysis.

AES/SAM and SIMS (PHI 660)

Our Scanning Auger Multiprobe consists of Auger Electron Spectroscopy (AES), Scanning Auger, Secondary Electron Microscopy (SEM), Backscattered Electron Microscopy (BSE) and Secondary Ion Mass Spectrometry (SIMS).  Capabilities also include an elevated temperature stage (800°C) and a cryogenic fracture stage. 

An upgraded LaB6 electron column provides a 10 mA maximum beam current.  A coaxial cylindrical mirror analyzer (CMA) provides easy alignment of the electron beam, of the analyzer focal point, of the ion beam, and no shadowing high performance (750 cps @10 kV, 0.05 nA).

FE-SEM/EDS (JEOL JSM-7001F and Bruker XFlash 6|60 EDS detector)

Quantiam houses a state-of-the-art Field Emission Scanning Electron Microscope (FE-SEM) accessorized with IDE’s MK4 EMI Cancellation System.  The microscope is capable of acquiring electron images with a lateral resolution of 1.2 nm at 30 kV.

The microscope also has the latest generation Bruker XFlash semiconductor SDD detector for energy-dispersive spectroscopy (EDS).  The large active area 60 mm2 chip together with the slim-line detector finger provide a large solid angle.  The XFlash 6|60 is predestined for use in applications with relatively low X-ray yield, as common in the area of nano-analysis.  As the detector also delivers a very good energy resolution with 129 eV at Mn Kα, 61 eV at C Kα and 66 eV at F Kα), it can also comfortably be used in the low energy range, which is also a requirement in this field.  The detector has a maximum pulse load of 1,500,000 cps providing instant spectrum visibility and live quantification.  The Bruker’s HyperMap option facilitates elemental maps acquisition which contains a spectrum for each pixel.  It enables on- and offline processing, live background removal and deconvolution.

SEM/EDS (JEOL JSM-6010LV and Bruker XFlash 5030 EDS detector) 

Quantiam also houses an “InTouch Scope” Scanning Electron Microscope (SEM).  This tungsten-tip microscope is user-friendly
(an entire series of imaging operation is carried out on a single touch-screen monitor).  A large specimen chamber allows samples up to 150 mm in diameter. It can acquire electron images with a lateral resolution of 4.0 nm at 20 kV.

The microscope is equipped with a Bruker series 5 XFlash semiconductor SDD detector for EDS.  The detector has a
large active area of 30 mm2 and a maximum pulse load of 750,000 cps allowing instant spectrum visibility and live quantification.  The Bruker’s HyperMap option facilitates elemental maps acquisition which contains a spectrum for each pixel.  It enables on- and offline processing, live background removal and deconvolution.

XRD Units by Bruker 

State-of-the-Art Bruker D8 Advance with DaVinci

Quantiam’s Bruker AXS D8 ADVANCE with state-of-the-art DAVINCI design – an all-purpose X-Ray Diffraction (XRD) solution.  The intelligent beam path components of this system provide true
plug’n play functionality requiring minimum user intervention.  The unit is equipped with Bruker’s LynxEye XE Super Speed Detector.  The unique combination of sensor chip and front-end electronics makes this detector the highest performing detector on the market.  Its superb energy resolution makes Kβ filters and secondary monochromators redundant.  A Flip-Stick sample changer allows us to collect diffraction patterns on nine samples automatically.

Bruker D8 Advance

Quantiam’s second XRD unit is upgraded to incorporate a LynxEye Super Speed Detector.  With Bruker’s compound silicon strip technology, the LynxEye detector dramatically increases measured intensities by approximately 200 fold without sacrificing resolution and peak shape.  A Flip-Stick sample changer allows us to collect diffraction patterns on up to nine samples automatically, unattended – an excellent tool for QA applications.  The unit has high temperature capability to 1,500°C for phase evolution as a function of temperature and atmosphere.

The unit, when equipped with a point scintillation counter, has a grazing angle capability for high surface sensitivity. 

Non-Destructive 3-D Laser Mapping of Tubular Internal Surfaces

Quantiam has worked with Laser Techniques Co (LTC)to adapt its laser mapping technology to tubulars used in petrochemical applications, providing non-destructive coating thickness mapping of internal surfaces with a resolution of +/- 6 microns.  The technology represents a quantum leap in non destructive Quality Assurance of coated complex shapes, and is further being adapted for surface finish mapping (through tubular length) and bulk inclusion analyses (with eddy current attachment).